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4H-N and 4H-Semi SiC substrates are key materials in the field of semiconductor technology, offering unique properties and promising applications. Silicon carbide (SiC) is a wide-bandgap semiconductor material known for its excellent electrical, thermal, and mechanical properties. The 4H crystal structure of SiC provides specific electronic properties suitable for various electronic and optoelectronic devices.
4H-N SiC substrates are typically n-type semiconductors, where nitrogen (N) dopants introduce excess electrons into the crystal lattice, making them suitable for applications requiring electron conduction. These substrates find applications in power electronics, high-frequency devices, and optoelectronics due to their high electron mobility and low on-resistance.
On the other hand, 4H-Semi SiC substrates exhibit semi-insulating behavior, making them ideal for high-power and high-temperature applications. The semi-insulating properties arise from intrinsic defects or intentional doping with deep-level impurities, leading to a high resistivity and minimal electronic conduction. These substrates are widely used in high-power radiofrequency (RF) devices, microwave electronics, and harsh environment sensors.
The fabrication of high-quality 4H-N and 4H-Semi SiC substrates involves advanced growth techniques such as physical vapor transport (PVT), chemical vapor deposition (CVD), or sublimation epitaxy. These techniques enable precise control over the material’s crystal structure, purity, and dopant concentration, resulting in substrates with superior electrical and structural properties.
In recent years, there has been growing interest in utilizing SiC substrates for next-generation electronic and photonic devices. The unique combination of wide-bandgap energy, high breakdown voltage, and thermal stability makes SiC substrates highly desirable for applications in power electronics, RF communications, and photonics. Furthermore, ongoing research aims to optimize the growth processes and material properties of SiC substrates to unlock their full potential in emerging technologies such as quantum computing, high-power lasers, and integrated photonics.
In conclusion, 4H-N and 4H-Semi SiC substrates represent essential building blocks for a wide range of semiconductor devices, offering distinct advantages in terms of electrical performance, thermal management, and reliability. Continued advancements in SiC substrate technology hold great promise for driving innovation in various fields, paving the way for more efficient and robust electronic and optoelectronic systems.
Diameter:2 inches, 3 inches, 4 inches, 6 inches or others
Grade | Zero MPD Grade | Production Grade | Research Grade | Dummy Grade | |
Diameter | 150.0 mm +/- 0.2 mm | ||||
Thickness | 500 um +/- 25 um for 4H-SI350 um +/- 25 um for 4H-N | ||||
Wafer Orientation | On axis: <0001> +/- 0.5 deg for 4H-SIOff axis: 4.0 deg toward <11-20> +/-0.5 deg for 4H-N | ||||
Micropipe Density (MPD) | 1 cm-2 | 5 cm-2 | 15 cm-2 | 30 cm-2 | |
Electrical Resistivity(Ohm-cm) | 4H-N | 0.015~0.025 | |||
4H-SI | >1E5 | (90%) >1E5 | |||
Doping Concentration | N-type: ~ 1E18/cm3SI-type (V-doped): ~ 5E18/cm3 | ||||
Primary Flat (N type) | {10-10} +/- 5.0 deg | ||||
Primary Flat Length (N type) | 47.5 mm +/- 2.0 mm | ||||
Notch (Semi-Insulating type) | Notch | ||||
Edge exclusion | 3 mm | ||||
TTV /Bow /Warp | 15um /40um /60um | ||||
Surface Roughness | Polish Ra 1 nm | ||||
CMP Ra 0.5 nm on the Si face | |||||
Cracks by high intensity light | None | None | 1 allowed, 2 mm | Cumulative length 10 mm, single length 2 mm | |
Hex Plates by high intensity light* | Cumulative area 0.05 % | Cumulative area 0.05 % | Cumulative area 0.05 % | Cumulative area 0.1 % | |
Polytype Areas by high intensity light* | None | None | Cumulative area 2% | Cumulative area 5% | |
Scratches by high intensity light** | 3 scratches to 1 x wafer diameter cumulative length | 3 scratches to 1 x wafer diameter cumulative length | 5 scratches to 1 x wafer diameter cumulative length | 5 scratches to 1 x wafer diameter cumulative length | |
Edge chip | None | 3 allowed, 0.5 mm each | 5 allowed, 1 mm each | ||
Contamination by high intensity light | None |
In summary, 4H-N and 4H-Semi SiC substrates have diverse applications in power electronics (PE), radiofrequency (RF), and microwave (MW) electronics, optoelectronics (OE), high-temperature electronics (HTE), harsh environment sensing (HES), and integrated photonics (IP). Their unique combination of electrical (EL), thermal (TH), and mechanical (ME) properties makes them indispensable for enabling next-generation electronic (E) and photonic (P) systems across various industries.
In summary, 4H-N and 4H-Semi SiC substrates possess a unique combination of electrical, thermal, mechanical, and optical properties, making them highly suitable for a wide range of electronic and photonic applications in various industries.
All of the other SiC polytypes are a mixture of the zinc-blende and wurtzite bonding. 4H-SiC consists of an equal number of cubic and hexagonal bonds with a stacking sequences of ABCB. 6H-SiC is composed of two-thirds cubic bonds and one-third hexagonal bonds with a stacking sequences of ABCACB.
What are Silicon Carbide (SiC) Wafers & Substrates? Silicon Carbide (SiC) wafers and substrates are specialized materials used in semiconductor technology made from silicon carbide, a compound known for its high thermal conductivity, excellent mechanical strength, and wide bandgap.
A SiC substrate, or silicon carbide substrate, is a crystalline material used as a foundation or base upon which semiconductor devices are fabricated. It is composed of silicon and carbon atoms arranged in a crystal lattice structure, typically exhibiting a hexagonal or cubic crystal structure. SiC substrates are engineered to have specific electrical, thermal, and mechanical properties that make them highly suitable for a wide range of electronic and optoelectronic applications.
SiC substrates offer several advantages over traditional semiconductor materials like silicon (Si), including:
Overall, SiC substrates play a crucial role in the development of advanced semiconductor devices for applications in power electronics, radiofrequency (RF) communications, optoelectronics, high-temperature electronics, and harsh environment sensing, among others. Their unique combination of electrical, thermal, and mechanical properties makes them indispensable for enabling next-generation electronic and photonic systems across various industries.